迎接納米測試挑戰,最全的納米測量攻略

發(fā)布時(shí)間:2014-2-26 15:53    發(fā)布者:eechina
關(guān)鍵詞: 納米測試 , 納米測量 , 納米
Keithley is helping advance the state of the art in a growing list ofnanotechnology applications—yours may be one of them. Six decades of experience in designing ultra-sensitive measurement tools allow us to provide university, corporate, and government labs around the world with solutions for investigating new material and device properties. Just as important, these solutions are designed for intuitive operation, so you’ll get the results you need quickly and simply. That means you can focus on your research, not on your test hardware.

We partner with organizations like the Institute of Electrical and Electronics Engineers (IEEE), leading Nanotechnology Centers of Excellence, Keithley customers, and other leading nanotechnology measurement tool vendors to create more complete solutions. The insight into emerging needs these working partnerships provide helps us deliver new capabilities faster

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jimcmwang 發(fā)表于 2014-10-31 11:27:58
迎接納米測試挑戰,最全的納米測量攻略
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